Fichier%3ADynamic_contact_angle_measurement.svg

Fichier:Dynamic contact angle measurement.svg

Guillaume Paumier, CC-BY. Printed publications: guillaumepaumier.com, CC-BY. Contact me: If you use this image outside of Wikimedia projects, I would be happy...

Fichier:Silicon microelectronics programs at the National Institute of Standards and Technology- programs, activities, and accomplishments (IA siliconmicroelec6731knig).pdf

Subjects: National Semiconductor Metrology Program (U.S.); Semiconductors -- Measurement Language English Publication date 1 April 2001 Current location IA Collections:...

Fichier:First NIST workshop on nanostructured material- report of an industrial workshop conducted by the National Institute of Standards and Technology (IA firstnistworksho5456shul).pdf

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Fichier:Proposed NASA HAVOC Missions to Venus.pdf

stagnation point heating  Databases span dimensions of Mach, dynamic pressure, and angle of attack • M∞: 1.5 to 50 • q∞: 1.E-8 to 6.E-2 bar • αT: 0 to...

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Fichier:Dynamic contact angle measurement.svg

Fichier:Silicon microelectronics programs at the National Institute of Standards and Technology- programs, activities, and accomplishments (IA siliconmicroelec6731knig).pdf

Fichier:First NIST workshop on nanostructured material- report of an industrial workshop conducted by the National Institute of Standards and Technology (IA firstnistworksho5456shul).pdf

Fichier:Proposed NASA HAVOC Missions to Venus.pdf

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