DescriptionNanoscope.jpg This instrument performs atomic force microscopy to measure surface characteristics and imaging for semiconductor wafers, lithography...
08:33 Limojoe 640×853×8 (397900 bytes) mikroskop atomárních sil MM AFM Nanoscope IIIa výrobce Digital Instruments English determination method: SHA-1...
DescriptionAFM - detail.jpg English: Veeco Multimode atomic force microscope with Nanoscope III controller and Quadrex module Source Own work Author Laundry...
DescriptionAFM - overzicht.jpg English: Veeco Multimode atomic force microscope with Nanoscope III controller and Quadrex module Source Own work Author...
